Stimulus and correlation matching measurement technique in computer based characterization testing

Constructive theory of characterization test is considered in a proposed article. The theory is applicable to an electronic nano devices characterization. E.g. is a currentvoltage test particularly differential conductance test. Another application is an auger currentelectron energy spectroscopy test. Generally small response of device under test on an applied stimulus is masked by an unknown deterministic background and a random noise. Characterization test in this signal corruption scenario should be based on correlation measurement technique of device response on applied appropriate i.e. optimal stimulus with optimal reference signal. The problem of co-synthesis of stimulus and the reference signal is solved here. This theory provides constructive solution to improve measurement accuracy and speed of characterization test. Proposed test system implementation, for example, may improve measurement accuracy or speed of auger current test by more than 100 times. Introduction. The major challenge in small scale device characterization is dependence plot and its informative parameters measurement. The dependence may be current voltage curve or auger current energy of electrons curve. Nano devices electrical characteristics are affected by quantum behavior, Figure 1, [1].